Thermal admittance spectroscopy study: preliminary observations of a Meyer-Neldel relationship in CdTe devices

The present work is an extension of our previous study of the traps in CdTe PV devices characterized by thermal admittance spectroscopy. Preliminary observations of a Meyer-Neldel relationship (MNR) in the thermal emission of carriers from the traps are presented. In addition, two devices processed identically to two devices with trap signatures at different points on the MNR line were characterized by photoluminescence spectroscopy (PL). An initial correlation between the MNR and the stability of devices during accelerated indoor stress testing is also shown.