Characterisation of european millimetre-wave planar diodes

This paper describes a process for characterisation of millimetre-wave planar diode chips. It comprises dc-characteristics, capacitance, and wide-band (7-220 GHz) scattering parameter measurements and parameter extractions from measurement results. As the first test items, we have characterised planar Schottky diode chips (varactor and mixer diodes) fabricated by Technical University of Darmstadt. We describe a coplanar waveguide test mount design applied for the measurements and show the measured and extracted results. The S-parameters at 7-220 GHz are obtained for several different bias voltages and currents.