Evaluation for intra-word faults in word-oriented RAMs

This paper presents an industrial evaluation of tests for intra-word faults in word oriented memories, applied to big arrays with bit-interleaved organization as well as to small arrays with bit-adjacent organization, in order to investigate the influence of the memory organization on the intra-word faults. The test results show that the intra-word faults are also significantly important for interleaved memories, even though that the cells within a single word are not physically adjacent.