Multifrequency microwave probing of nonlinear targets

Numerical simulations of the process of nonlinear scattering of powerful microwave pulses by targets, which include semiconductor components, have been done. An attention is given to an incidence of several short probing pulses at different carrier frequencies. Numerical simulations are based on integral equations for induced current. A possibility to use multifrequency nonlinear scattering with releasing both sum frequency and difference one has been demonstrated.