The influence of defects on the emission spectra of high power laser diodes

This paper gives the electroluminescence (EL) spectra analysis of high power laser bars (diodes) by simple semianalytic models in addition to the fast Fourier transform to simulate laser cavities with multiple defects. These models, based on plane-wave propagation and normal incidence boundary conditions, allow the defect positions to be determined and the estimation of their reflectivities and losses.