Initial experimental results of re-trapping studies on a large area diode on RITS-3

As part of a continuous research effort into advanced flash radiographic sources using intense electron beams, Sandia National Laboratories (SNL) has been investigating coupling vacuum power flow into various high power diodes. Of key importance is the issue of the re-trapping of electrons from the sheath current of a magnetically insulated vacuum transmission line (MITL) into the diode load. Results of electron re-trapping studies on a large area diode (LAD) on the RITS-3 accelerator are presented here. RITS- 3 is a 4.5 MV, 160 kA inductive voltage adder pulsed power accelerator. Results show that re-trapping of the sheath current does occur and compares favorably with particle-in-cell (PIC) predictions of the LSP modeling code.