Low-cost strategies for testing multi-gigahertz SOPs and components

This presentation provides a summary and status of three on-going research projects that are developing new low-cost techniques for testing devices with multiple signals of high-speed (>1 GHz) data. Each project uses commercially available components to keep costs low, and provides the circuits necessary for testing specific applications. This presentation provides a summary of these projects, recent achievements, and future directions as they might apply to testing system-on-package (SOP) and other components.