Extraction of S-parameter using the three-dimensional transmission-line matrix (TLM) method

The validation of a simple technique for extraction of lines parameters using numerical simulation with the transmission-line matrix (TLM) method is presented in this work. The scattering parameters S/sub 11/ and S/sub 21/ obtained were in excellent agreement comparison with the SDA (spectral domain analysis) method. Beyond these parameters, we obtain easily from the T-equivalent circuit the impedance and admittance matrices. Besides showing the efficiency of this technique, it is proved that the TLM method is a powerful tool for simulation of integrated circuits in the time domain.