A testing methodology for large scale hybrid VLSI

A test methodology for large systems-on-a-chip designed by the Discretionary Interconnect One Day Electronic System (DIODES) system for the rapid prototyping of digital signal processing (DSP) electronic systems is discussed. DIODES is based on the concept of building a library of chips that implement a set of operators used in DSP algorithms, and using these chips to implement DSP algorithms by implanting them on an alumina substrate and interconnecting them appropriately to realize the desired functionality. Test hardware capabilities are discussed. A description of test circuitry is given. The test methodology is compared with boundary scan.<>