Impact of Auxiliary Particle Filter Diagnostic Model on Prognostic Model for IGBT Power Modules

the shift towards renewable energy sources (RES) and the electrification of systems are central to combating climate change and achieving net-zero emissions (NZE). Insulated gate bipolar transistors (IGBTs) play a crucial role in energy conversion and electrification. However, their susceptibility to degradation makes reliability analysis and lifespan prognostics key areas of research to support predictive maintenance. The proposed paper will examine the impact of applying an auxiliary particle filter (APF) diagnostic method on a hybrid remaining useful life (RUL) prognosis of IGBT power modules. This implementation aims to enhance lifetime estimations while considering the challenge of on-line applications in noisy environments.