Hardware Design Margin Model for IC Test and Case Analysis

As the complexity of integrated circuits increases, the sensitivity of ICs to external electrical characteristics has increased significantly. Insufficient hardware design margins have become a major cause of failures in screening tests. This paper proposes a dynamic margin model for hardware design by quantifying the coupling relationship between the output signal randomness interval and the input tolerance range. It derives the calculation method for the stable operating margin and reveal the dynamic effects of temperature, aging, and other factors on margin boundaries. Taking power supply noise margin as a case study, it analyze the interaction between the power output range and CPU voltage requirements under different operating conditions, demonstrating the model's effectiveness in identifying intermittent failure mechanisms. This provides theoretical and practical guidance for hardware design and high-reliability IC tests.