Review of High-Power-Microwave Effect Mechanism Research on PIN diode Limiters Paper

Research into PIN limiter damage mechanisms is vital to advancing high-power-microwave (HPM) protection and effect technologies for electronics. This paper presents the structure and basic principles of PIN limiters and reviews current research on HPM damage mechanisms in PIN limiters. It analyzes the influence of key HPM parameters (and their combinations), as well as the physical structure of the limiters themselves, on damage thresholds. Finally, based on the literature, potential future research directions for PIN limiter effect mechanism studies are summarized.