Research on Micro-Defect Image Enhancement Technology by Integrating Zero-Shot Superresolution and OpenCV

This paper proposes an innovative scheme for micro-defect image enhancement that integrates Zero-Shot SuperResolution and OpenCV technologies. Zero-Shot SuperResolution enables super-resolution reconstruction based on the internal information of a single low-resolution image, which can effectively improve image resolution and highlight micro-defect details without relying on a large amount of annotated data. OpenCV, with its rich and efficient image processing algorithms, further enhances defect features and suppresses noise. By organically combining these two technologies, this study achieves high-quality enhancement of micro-defect images, providing a more accurate foundation for image analysis in the field of industrial inspection. Experimental results demonstrate that the integrated technology can significantly improve the clarity of micro-defect images and the accuracy of defect detection, showing promising application prospects in industrial defect detection.