Computer-aided design and tester independence of test information standards

The authors present electronic product data languages for the exchange of electronic product data between design, test, and support environments and describe the Tester Independent Support Software System (TISSS). TISSS has been used as a testbed for the demonstration and first use of these languages, proving the feasibility of using computer-aided design and tester-independent electronic product data for the capture and use of electronic design and test information for the automatic generation of electrical test programs and life cycle support database. The TISSS and the product data languages have been proven true for complex digital microcircuits. Their use for providing the same functionality and support for complex digital line replaceable modules during a TISSS demonstration for the Advanced Tactical Fighter is considered. The TISSS and TISSS product data languages have benefited from early use by the generic very high speed integrated circuit (VHSIC) Spaceborne Computer Program.<>