Advanced Built-In Self-Test (BIST) Architecture for Comprehensive Testing of Virtex Ultrascale FPGA Systems

Testing Virtex Ultra Scale FPGAs poses challenges due to complexity and the critical need for high reliability in diverse applications. Traditional Built-In Self-Test (BIST) methods often lack efficiency and thoroughness, necessitating innovative approaches. Reliable testing is crucial to ensure functionality and quality before deployment in safety-critical and commercial applications, avoiding system failures and financial losses. Henceforth, this research presents a novel Advanced Extensible Interface (AXI) based BIST, which integrates advanced TPG for pattern generation, dynamic MUX for flexible signal routing, adaptive fault detection in the CUT, and ORA for precise response analysis. FPGA capabilities are leveraged to enhance test coverage and reduce test time. The Experimental results demonstrate improved reliability with significant reductions in test duration and enhanced fault detection capabilities. The Engineers, researchers, and developers in FPGA design, testing, telecommunications, aerospace, and high-performance computing will find this innovative BIST architecture indispensable for enhancing FPGA reliability and performance in demanding applications.