Traceable characterization and simulation of charge injection in CMOS electronic switches

This manuscript focuses on the research activities conducted within the framework of the European Partnership on Metrology (EPM) project True8DIGIT. The primary objective is to develop a calibration method for the precise characterization of charge injection in commercial CMOS electronic switches, which are integrated into the track-and-hold input stages of high-precision integration digitizers. The injected charge generated during the on-off of the switch is detected by means of a set of calibrated capacitors, whose voltage variation across its terminals is measured with a digital sampling voltmeter calibrated against a Josephson voltage standard. The method achieves a resolution of approximately 1 pC, with a Type-A uncertainty ranging from 10 fC to 70 fC across different CMOS switches, which is sufficient for the intended purpose.