Accuracy Evaluation in VNA-Based EVM Measurements of Unmatched SOI Cells for Wi-Fi

This work reports on the accuracy of broadband Error Vector Magnitude (EVM) measurements based on a vector network analyzer (VNA) enhanced with wideband active load-pull (WALP) capabilities for the characterization of unmatched Silicon-on-Insulator (SOI) amplifier cells. Special focus is given to low EVM values that can be detected at small power levels, which is a key requirement for Wi-Fi applications. Both signal-and system-related quantities are considered in the investigations to assess their influence on EVM performance.