Reliability Evaluation in Operational Amplifier at Cryogenic Temperature

The reliability and performance degradation of operational amplifiers (OpAmps) under extreme cryogenic conditions is critical to the design and development of electronic systems for particle detection experiments such as the Deep Underground Neutrino Experiment (DUNE). This research investigates the lifetime and operational integrity of OpAmps subjected to accelerated aging in liquid nitrogen (LN2) at 77 K. This study examines key performance metrics, including offset voltage, quiescent current, AC gain, and DC gain, which were analyzed to assess the effects of cryogenic exposure accelerated by over-voltage supply stress. Experimental results demonstrate a notable increase in offset voltage and quiescent current, indicative of aging effects, with changes of 20 % and 50 %, respectively. Additionally, the open-loop gain at 500 kHz decreased by 2 %. The DC open-loop gain displayed variations within the uncertainty range, suggesting limited significance in long-term reliability evaluation. The total duration of the lifetime characterization activity was approximately 920 hours, distributed between a stress phase, a waiting phase, and a testing phase. The results contribute to the state of the art of cryogenic electronics by validating the system and procedure developed to perform automated continuous loop stress tests and characterizations on devices at cryogenic temperatures. Then, this work provides a methodological foundation for future studies on cryogenic reliability and facilitates the development of robust electronic circuits capable of enduring extreme environmental conditions.