An Open TEM Cell Design Using PCB Material and Analysis of Stands on Electromagnetic Field Uniformity

This paper presents an open transverse electromagnetic (TEM) cell for the electromagnetic interference and compatibility (EMI and EMC) testing of electronic devices. A cost-effective cell design is presented, with the inner conductor and side walls made with double-sided printed circuit board (PCB) material and FR4 substrate. The $S$ parameters of the cell are simulated using the finite element method (FEM) and validated with measurements. Field measurements inside the TEM cell were conducted using an inductive loop magnetic field probe. The influence of the cell stands on the uniformity of the electromagnetic field inside the cell is evaluated.