High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters

Testing high-resolution Digital-to-Analog Converters (DACs) often requires costly equipment, such as Automated Test Equipment (ATE) or high-resolution Analog-to-Digital Converters (ADCs). This paper presents a Built-In Self-Test (BIST) approach for high-resolution DACs, leveraging a 14-bit ADC to effectively test a 20-bit DAC. By embedding this solution within the DAC design, the proposed approach achieves scalability and significantly reduces test costs while maintaining good linearity and dynamic performance. The approach is validated through simulation results of the 20-bit DAC designed in GF22nm FDSOI technology and the BIST scheme modeled and validated using MATLAB. Results from 100 Monte Carlo simulations validate the robustness of the proposed testing scheme, achieving an INL estimation error of less than 0.4 LSBs.