A Generic Solution to Handle System in Package Efuse Test in Multiple Flow

Many ATE Test programs still rely on a code based Efuse Test Method, resulting in lengthy development times, extended test durations, and a higher risk of device rework. Furthermore, the presence of one-time-programmable fuses introduces the risk of critical quality issues arising from coding errors.This paper addresses the challenges of SiP devices’ fuse test procedure, data structure and programming ways on 93K SMT8. This adaptable solution minimizes coding efforts, ensures quality, and provides the best time-to-market (TTM) and test time for various customer scenarios. The effectiveness of this solution will be demonstrated through test cases used in several customers' Common Building Block (CBB), showcasing its ability to significantly reduce offline time and achieve successful online verification.