Test of higher-power Semiconductors: Challenges and Solutions

The rapidly evolving landscape of technology demands higher-power semiconductors [1] thereby posing significant challenges for engineers. Recent advancements in automotive, consumer electronics, IoT, PMICs, and LED drivers have heightened the need for increased operating voltage and current. However, testing these components for optimal yield and quality while managing costs has become increasingly complex. As a solution to these test challenges, this work presents a highly integrated ±50V, ±1A Parametric Measurement Unit (PMU) System-on-chip (SOC). PMU features of Four-Quadrant operation, accuracy, wide dynamic range and low-leakage enable the Device-under-test (DUT) to be tested in any operating condition. Moreover, the Automated Test Equipment (ATE) and DUT are protected by current- and voltage-clamps, and temperature, voltage, current and force/sense Kelvin faults alarms.