Research on PS-Level Clock Skew Testing Solution for High-Performance Clock Conditioner on V93000

Clock regulators are commonly built into the systems that drive multiple high-speed AD/DA converters based on the JESD204B protocol. In these systems, precise synchronization among the clock outputs of the clock regulators is significant. The time deviation (skew) between channels is a key indicator for synchronization performance. It is usually at the picosecond (ps) level and is related to the accuracy of data transmission in the system. Generally, this parameter needs to be tested in mass production. Aiming at the challenges of high requirements for the number of test channels, high test stability, and high test costs of such parameters in mass production tests.This paper proposes a jitter histogram test method based on the PS5000 digital card of the V93000 platform. By dynamically adjusting the sampling edges, statistically analyzing the level-transition distribution over multiple cycles, and combining with a moving-average algorithm to extract the median value of the transition edges, high-precision measurement of multi-channel clock skew is achieved. Experiments show that this method has a consistent trend with the test results of an oscilloscope under different skew settings. The result fluctuation is controlled within ±6ps, and the PS5000 has abundant digital channel resources, which can realize the simultaneous testing of multiple devices and significantly reduce the mass-production cost.