Single and Multiple Fault Detection in Analog Circuits Using V-Transform Coefficients

This paper introduces a novel method for detecting soft faults in linear and non-linear analog circuits. The proposed technique, V-Transform coefficient (VTC) testing, is an extension of existing coefficient-based methodologies. The proposed method effectively identifies various fault conditions by analyzing the V-Transform coefficients of the circuit's output. Extensive simulations were conducted using SPICE to validate the proposed method, injecting various faults into elliptic and leapfrog filters. The results demonstrate the effectiveness of V-Transform coefficient testing in accurately detecting both single and multiple faults. Our findings highlight the potential of this approach for improving the reliability and fault tolerance of analog circuits.