A Low-Complexity True Random Number Generation Scheme Using 3D-NAND Flash Memory

Unpredictable true random numbers are essential in cryptographic applications and secure communications. However, implementing True Random Number Generators (TRNGs) typically requires specialized hardware devices. In this paper, we propose a low-complexity true random number extraction scheme that can be implemented in endpoint systems containing 3D-NAND flash memory chips, addressing the need for random numbers without requiring additional complex hardware. We successfully utilized the randomness of the rapid charging and discharging of shallow charge traps in 3D-NAND memory as an entropy source. The proposed approach only requires conventional user-mode erase, program, and read operations, without any special timing control. We successfully extracted random bitstream using this scheme without a post-debiasing process. We evaluated the randomness of the generated bitstream using the NIST SP 800–22 statistical test suite, and it passed all 15 tests.