Broadband RF Characterization Test Setup for Millimeter Wave Applications

This paper presents a versatile test setup configuration capable of reporting broadband large signal on-wafer characterization data over various frequency bands and up to 110 GHz. Millimeter wave characterization is often frequency band limited and requires various test hardware to be swapped when frequency focus evolves. Exploring various frequency bands is therefore time consuming as well as prone to measurement uncertainties addition when new measurement errors are introduced during the next calibration event. The presented coaxial test bench configuration allows measuring both small and large signal performance without the necessity to reconfigure the test hardware nor recalibrate the test bench. This work provides a descriptive overview of the test setup and discusses application by reporting measurement data of an E-band GaN power amplifier.