Reliability Qualification Challenges and Flow for Analog Qualification Test Vehicle

Analog IP design encompasses a wide range of Analog Mixed Signal blocks of varied and different specifications. Ensuring reliability of Analog IPs on silicon is thus a challenging task, considering standard device-level reliability coverage may not cover all performances and specifications for Analog IPs. To master this, the use of dedicated Analog Qualification test vehicles (AQTV) is required. This understanding aids in optimizing the design and process (silicon) to attain the preferred balance between performance and reliability needs. In this paper, a workflow is proposed for Qualification of Analog Test Vehicles under High Temperature Operating Life (HTOL) conditions. This AQTV involves multiple IP: GPIOs, digRF, PLL, Oscillator, Compensation, I2C in P28 technology in single chip. Additionally, improvements are suggested to the test and design environments to proactively address future challenges. This industrial proactive approach not only leads to a more efficient reliability methodology with fewer iterations, but also reduces the cost of development and test for standard analog ICs. This approach aims to optimize time while presenting test results from a practical case as an initial step towards developing an efficient qualification methodology. To ensure consistency, test results are cross-verified using cad simulation by recreating a measurement setup similar to the test environment for a direct comparison between the measurement and simulation results.