Overview of Dynamic Characterization of Switches for Three Phase Voltage Source, Current Source, and Matrix Converter Applications

The double pulse test (DPT) is a widely accepted method to evaluate the dynamic performance of power devices. However, the results are accurate only if the DPT setup emulates the commutation loop. This paper presents an overview of DPT methods for three-phase two-level voltage source, two-level current source, and direct matrix converter applications. The design criteria for the three DPT circuits are presented. Probe selection and the impact of switching voltage-current (V-I) timing misalignment on the testing results are discussed, and a V-I alignment approach is introduced for all the DPT systems. A 1.2 kV/15 A SiC-based DPT presents the results for the three configurations. The impact of parasitic capacitances on the switching losses and the methods to minimize the effect on the DPT results are finally presented.