Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter

In this article, capability for traceable impedance measurements of Type-N coaxial devices implemented using an LCR meter is presented. An LCR meter, operating at frequencies between 1 kHz and 1 MHz, was fit with a 4-terminal pair (4-TP) to coaxial adapter to interface with Type-N devices. An error model for calibrating the LCR meter and steps to characterize the Short- and Open-circuit calibration standards are detailed. To verify the measurement system, measurements were compared with vector network analyzer (VNA) techniques. Finally, the measured impedance of a well-matched $50~\Omega $ Type-N power sensor was converted to linear reflection coefficient, and an uncertainty for linear magnitude in the region of 0.2 Milli-units (mUs) ( $k =2$ ) is reported. This capability has the potential to provide measurements of reflection coefficient of devices in coaxial line with very low uncertainties.