Characterization of microwave response of the mesh-pattern vs. uniformly-coated indium-tin-oxide indicator for the thermoelastic optical microscope: a comparative analysis

The microwave absorption characteristics of Hilbert-shape mesh-patterned ITO structure were examined using thermoelastic optical microscope (TEOM). Specifically, the study investigated how the distribution of the microwave electromagnetic field changes when comparing ITO indicators with mesh-pattern to those with unformal structure within the 8-12 GHz range. The findings demonstrate that by introducing certain dispersion anisotropy in the absorbing layer of the ITO indicator, both the sensitivity of the microscope and the ability to image different spatial components of the incident microwave field separatel y can be significantly enhanced. These results offer valuable insights for optimizing the microwave absorption process in the development of high-performance thermoelastic devices based on ITO films.