An EMI/EMC Test Bed for EMI Susceptibility Evaluation and Weakness Detection

The progress of power semiconductor devices allows faster switching and more compact design, often resulting in the electromagnetic interference issue. One critical aspect of power electronic circuit design concerns the electromagnetic compatibility of its components, such as the gate drive printed circuit board (PCB) and other control PCBs. Power electronic converter design and/or installation usually focuses on EMC compliance with standards regarding conducted or radiated EMI at the boundary of or outside the converter. Such compliance often is achieved by containing the noise inside the converter, exacerbating the EMI susceptibility of PCBs. This paper presents an EMI/EMC test bed capable of quantifying the robustness and identifying the weakness area of a design from an EMI susceptibility standpoint. Details of the test bed implementation and experimental results are provided to validate this methodology.