Advances in Measurement and Simulation of Transients

Transients are of special interest in connection with the EMC of electronic devices or systems respectively. In particular transients, which are essentially described by their rise time, amplitude and energy content, often occur randomly. Typical sources of transients are e.g. ESD, LEMP, NEMP, UWB or switching operations in power electronics. There is a great demand for protective measures against interfering transients. Of special interest in this context are nonlinear protection circuits for suppressing transients, which not only may cause disturbances in electronic systems but also destructions as well as irreversible variations of characteristics and parameters of electronic components.