On-Chip Measures to Achieve EMC

Compliance with EMC requirements has to be reached at product level. For economic reasons measures need to be taken at the PCB and even better at the IC level to obtain an optimal result. In IC industry, a lot of measures are known but not made public. In this paper a number of general on-chip measures in combination with their PCB application will be reported. The defined models can also be used to predict RF emission with a certain measurement method. However, the selection of the test method has a great influence on the perceivability of the measures taken.