Resolution Maps: A Novel Metric for Electrical Impedance Tomography

Resolution maps are a novel analysis method for electrical impedance tomography (EIT) that quantifies the precision and accuracy of image reconstruction at different locations within the region of interest. A projection operator is introduced which projects individual mesh elements of the simulated conducting area into the basis of orthogonal functions that span the data space of chosen measurements. Resolution maps are then made by evaluating these projections with regard to three different figures of merit: mean displacement from the original mesh coordinates, radial standard deviation, and ellipticity. This novel metric allows for comparisons between candidate sets of measurements and electrode geometries, as well as comparisons between locations in the same mesh.