Effect of Film Thickness on the Structural, Morphological, Optical, and Electrical Properties of TiO2 Films Prepared using Sol-Gel Process

In this work, we have fabricated four different thicknesses of TiO2 films using a simple, flexible, and cost-efficient sol-gel technique. The influence of thickness variation on the material properties is systematically studied using X-ray diffraction (XRD), Laser Raman Spectroscopy (LRS), Scanning Electron Microscopy (SEM), and UV-visible spectroscopy. Additionally, current-voltage (I-V) measurements are conducted by depositing Titanium/Gold (Ti/Au) contacts on top of the films to determine the dark current of the TiO2 films. The results obtained from this work provide a valuable understanding of the correlation between film thickness and the changes it introduces to its material and electrical properties. The study will help in optimizing the properties of the films for their further utility in a wide range of applications in research and development.