Thermal investigations as part of a remote phosphor aging test

This paper briefly presents the LM80 based aging of a mid-power LED type, as well as the remote aging of the phosphor components used in its production. During the examination of the results, the effects of various stress conditions on aging are presented, such as temperature, forward current and blue light excitation. The tests are also supported by thermal imaging. The results of the case-level LEDs and the remote phosphor samples are presented separately, but the final conclusion is drawn by examining the separate measurement results together. Based on the test results, the possibility of an error in the real Rth readings arises, the estimated value of which is derived in the paper.