Near-Field Analog Correlation of Thermal Noise Signals at X-Band

This paper presents an analysis of correlation between two thermal noise signals received in the near field from a lossy uniform material at room temperature. The more general analysis is adapted to a specific case that can be experimentally validated. The proposed experiment is designed from 8–12GHz using open-ended WR90 waveguide probes on a cylinder with a diameter of 15cm filled with saline. Full-wave simulations combined with the analog correlation model show that the measured correlated voltage varies from tenths of a milivolt, to tens of microvolts as the angle of separation between waveguides changes.