A New Five-layer Differential Magnetic-Field Probe With High Sensitivity

This work introduces a novel differential magnetic-field probe that incorporates parasitic elements. The probe features a pair of shorted differential loops as the parasitic components, which significantly boost detection sensitivity due to the expanded detection area. The construction of the proposed probe includes a U-shaped loop with dual outputs serving as the primary element, supplemented by a pair of shorted differential loops acting as parasitic elements, a set of shorted vias, a set of connected vias, and numerous shielded vias. First, the usual single-loop probe is applied to measure the electric and magnetic field components at the same time. Subsequently, a pair of shorted loops are integrated into the differential single-loop probe to function as parasitic elements, thereby increasing the reception of magnetic flux. To demonstrate the design rationality, the correspondingly simulated results are given in this work. Ultimately, the probe with integrated parasitic elements is crafted, printed, and assessed. The simulation results indicate that the developed probe exhibits high detection sensitivity.