Time-dependent Resistance-based Dynamic Behavior Model of Spark Gap under ESD Pulse

This paper investigates the dynamic response characteristics of spark gap structures on printed circuit boards (PCB) under electrostatic discharge (ESD). A gas discharge tube (GDT) is selected as the research subject. Initially, voltage and current signals at the device ports are measured under transmission line pulse (TLP) excitation, and the variation in the time lag of the spark gap structures with different voltage levels is analyzed. Subsequently, a dynamic behavior model, based on a time-dependent typical arc resistance model, is developed to predict the response of the GDT to TLP pulses. This system-level model is further validated through experiments using an electrostatic generator excitation.