Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch Design

Soft errors have been a severe threat to the reliability of modern integrated circuits (ICs), making hardened latch designs indispensable for masking soft errors with redundancy. However, the added redundancy also masks production defects as soft errors; this makes it hard to detect defects in hardened latches, thus significantly reducing their reliability. Our previous work proposed the scan-test-aware hardened latch (STAHL) design, the first for addressing the issue of low defect detectability of hardened latch designs. However, STAHL still suffers from two problems: 1) it is not self-resilient to soft errors and 2) a STAHL-based scan design requires one additional control signal. This article proposes a high defect detectable and single-event-upset (SEU)-resilient robust (HIDER) latch to address the issues of the low defect detectability of existing hardened latches and the STAHLs lack of SEU-resilient capability. Two scan designs [HIDER-based scan-cell-S (HIDER-SC-S) and HIDER-based scan-cell-F (HIDER-SC-F)], as well as two corresponding test procedures, are proposed to fully test HIDER latch with only one control signal. Simulation results show that the HIDER latch achieves the highest defect coverage (DC) in both single latch cell detection and scan tests among all existing hardened latch designs. In addition, the HIDER latch has much lower power and a smaller delay than STAHL.