Dynamic Hysteresis Model and Loss Prediction of GO Silicon Steel Under DC-Biased High-Frequency Excitation

A dynamic hysteresis model based on the loss separation theory is proposed to simulate and predict the total loss of grain-oriented (GO) silicon steels under high-frequency excitation with DC-bias. The skin depth is included in the equations of the classical eddy current field intensity considering the inhomogeneous distribution of the magnetic field under high frequency excitations. Besides, the DC-component of the excitation is also considered in the derived classical eddy current field equation. The nonlinear property of magnetic materials is accounted by discussing the saturated and the unsaturated operating conditions separately. The measurement results of a typical GO silicon steel are applied for the validation of the proposed dynamic hysteresis model. The accuracy and the loss component of the simulation and the loss prediction of silicon steels under DC-biased excitations are analyzed in detail.