A Cross-Type $E_{x}$ Probe with a High $H_{y}$ Suppression

Traditional tangential electric field $(E_{x})$ probe suffers critical orthogonal tangential magnetic field $(H_{y})$ interference, which greatly destroys the accuracy of the probe. In order to reduce the $H_{y}$ interference, a cross-type $E_{x}$ probe with a high $H_{y}$ suppression is proposed in this work. The differential mode conducted current excited by $H_{y}$ is eliminated at the proposed crossed structure by counteraction, which significantly improves the $H_{y}$ suppression. The proposed cross-type $E_{x}$ probe and traditional $E_{x}$ probe are fabricated and compared to validate the probe performance. Measured frequency responses illustrate that $E_{x}$ induced voltage is at least 21.8 dB larger than that of $H_{y}$ for the cross-type $E_{x}$ probe from 1 GHz to 6 GHz.