An Offset-Cancellation Technique Using Charge-Trap Transistors and Asynchronous Programming Scheme

In this article, a novel offset-cancellation (OC) technique is proposed, utilizing differential pair Charge-Trap Transistors (CTTs) to cancel offset voltage (VOS). The threshold voltage (Vth) degradation of programmed CTTs is characterized and modeled in TSMC 22-nm technology. By utilizing the Vth degradation model of CTTs, an asynchronous programming scheme is proposed to selectively program one of the CTTs based on the differential Vth (Vth) in each programming (PRG) operation of the differential pair CTTs. The experiment shows that the Vth effectively reduces to less than 1mV, and displays negligible retention loss at 27C and 85C based on the differential pair CTTs and asynchronous programming scheme.