Trap Spectroscopy from the Dielectric Isothermal Step Response: Theory and Simulations

The isothermal response of a dielectric subjected to a DC field or to an initial charge deposit is in a large part governed by charge trapping in progressively deeper levels. The distribution of the traps in energy may therefore be deduced from the absorption current, or from the potential decay. The general theoretical problem is described here in the frame of multiple trapping theory, illustrated by simple simulations. The limits of a commonly used simplification using the demarcation energy are underlined, and suggestions are made to apply more sophisticated techniques.