Few-Shot Specific Emitter Identification Leveraging Neural Architecture Search and Advanced Deep Transfer Learning

Specific emitter identification (SEI) has emerged as a notable device authentication technology, distinguishing various emitters through the unique radio frequency fingerprint (RFF) inherent in wireless devices. Traditional SEI methods, often hindered by time-consuming manual feature extraction, struggle with complex encrypted signals. The advent of deep learning, with its robust feature extraction capabilities, has significantly advanced SEI, yet it typically demands extensive radio frequency signal samples and falters with limited (i.e., few-shot) samples. Our proposed few-shot SEI (FS-SEI) approach, integrating neural architecture search (NAS) and advanced deep transfer learning (DTL), adeptly identifies few-shot long-range (LoRa) devices. This method begins with NAS to autonomously tailor optimal network architectures for SEI tasks, followed by pre-training on extensive auxiliary datasets to extract general RFF features of LoRa devices. Transfer learning then fine-tunes these features for distinctiveness with compact intra-class distances. By only utilizing few-shot LoRa data for final parameter adjustments, the classifier rapidly assimilates new categories. Simulations confirm our FS-SEI method’s superior accuracy over classical approaches, with visualized feature analysis underscoring its distinguishing and generalizing prowess.