FPGA-based memory test system design and test algorithm implementation

This article introduces the characteristics of FPGA board-level test systems and outlines some common memory fault models and memory test algorithms. The memory test system is constructed by utilizing the FPGA chip of Xilinx Company, which has the advantages of low cost, high flexibility and configurability compared with the traditional ATE machine test, making the memory test more convenient and faster. This system consists of FPGA control board and test board to form the test system, using Verilog language to develop the hardware system, making read/write control module to realize the memory function test. Three basic test algorithm modules, namely, MSCAN, Checkerboard and March, are also completed. Finally, the 23K256 SRAM from Microchip Company is used as the chip to be tested to verify the system, and the memory read/write function test and graphic algorithm test are successfully experimented, and the function test passes, which verifies the function of the test system.