An 8×8 Event-Based Vision Infrared Sensor ROIC With Adaptive Threshold Voltage Generation Circuit

This brief presents an $8\times 8$ event-based vision readout integrated circuit (ROIC) for the InGaAs infrared detector. Traditional event-based vision sensors (EVS) use predefined threshold voltage to generate output events, which could fluctuate according to the corner or temperature and increase the error event rates. In order to solve this problem, an adaptive threshold voltage generation circuit is proposed. By using this adaptive circuit, the simulated threshold voltage $V_{TH}$ variation is decreased from 60–200 mV to 128–132 mV, and the error event rate is optimized from 5%–25% to 2.5%–5% in different corners and temperature conditions. The sensor ROIC is implemented in 40 nm CMOS process and the pixel pitch is $40~\mu $ m. The power consumption is 16 mW with an area of 1.53 mm2. The measured events latency is $2~\mu $ s and the response frequency is 5 kHz.