A novel fast calibration method for NVNAs based linearity setup

This paper deals with a new calibration procedure dedicated to on-wafer passive load-pull NVNA setups that allows the search of optimal impedances (associated with e.g. maximum Power Added Efficiency (PAE max), optimal linearity (NPR max). The originality of this work stands in a new calibration procedure for the load-pull setup that permits a drastic reduction of time compared with a conventional calibration. This setup is driven by a tailored Unequally Spaced Multi Tones (USMT) signal that has been already proved to be an efficient tool for the measurement of the Noise Power Ratio of nonlinear devices. The search for the optimal load impedance to reach the PAE max is applied to an UMS Foundry on-wafer 4 x 50 μm GaN transistor in Ka-band.