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Improving the Reliability of FPGA CRO PUFs | IEEE Conference Publication | IEEE Xplore

Improving the Reliability of FPGA CRO PUFs


Abstract:

This paper presents a novel technique that greatly improves the reliability of FPGA-based CRO PUFs. We improve upon existing CRO implementations and increase the number o...Show More

Abstract:

This paper presents a novel technique that greatly improves the reliability of FPGA-based CRO PUFs. We improve upon existing CRO implementations and increase the number of configurations per CLB tile from 16 384 to 1.1 × 1012• To maximize reliability, each CRO pair must be configured to maximize its frequency difference. This requires using a novel technique that reduces the configuration search space from 1.1 × 1012 to 256. Our CRO PUF achieves 100% reliability within the FPGA's maximum rated voltages. We believe that this is the first FPGA PUF that can achieve this level of reliability without the use of post-processing. We also show that in some cases, our CRO may be reliable enough to omit the ECC that is usually required in PUF-based key generation circuits. This allows our CRO PUF to provide the reliability required for key generation while reducing the latency, complexity, and area overhead of ECC algorithms.
Date of Conference: 04-08 September 2023
Date Added to IEEE Xplore: 02 November 2023
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Conference Location: Gothenburg, Sweden

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