Fully-Adjustable Test Signal Generation Module with Multi-Functional Outputs

The development of digital technology has driven the progress of the digital field. As a result, the development and testing of these complex digital systems require integrated test equipment with various functions to perform various stages of testing to ensure the effectiveness and accuracy of the system. The digital test signal plays an indispensable role in the testing process of digital systems. It is widely used as a test excitation source in the field of time-domain measurements such as integrated circuit testing, bus testing, and electronic measure-ments. However, traditional digital test signal generators are pretty bulky and limited in terms of test signal options and functions. This makes them inadequate for handling complex test scenarios. In order to tackle the problems mentioned above, this paper proposes a new architecture of a fully adjustable multi-functional digital test signal generator based on Field-Programmable Gate Arrays (FPGA). This design approach reduces the use of hardware resources as well as integrates multiple digital test signal generation. Based on the proposed new design methodology, we have implemented a 16-channel digital test signal generator. The generator is capable of simulating a variety of digital test signal generation, and the 16 output channels can be independently controlled. Output digital test signal data rate is 1 kbit/s to 100 Mbit/s, adjustable resolution is 1 kbit/s. Customizable editing length 16 kbit/CH. Output signal supports voltage conditioning, output level range -1 V to +5 V, resolution 10 mV. And the rise time and fall time of the output signal can be adjusted.